Method for Predicting Reliable Lifetime of SOI Mosfet Device

ABSTRACT

Disclosed herein is a method for predicting a reliable lifetime of a SOI MOSFET device. The method comprises: measuring a relationship of a gate resistance of the SOI MOSFET device varying as a function of a temperature at different wafer temperatures; performing a lifetime accelerating test on the SOI MOSFET device at different wafer temperatures, so as to obtain a degenerating relationship of a parameter representing the lifetime of the device as a function of stress time, and obtain a lifetime in the presence of self-heating when the parameter degenerates to 10%; performing a self-heating correction on the measured lifetime of the device by using the measured self-heating temperature and an Arrhenius model, so as to obtain a lifetime without self-heating influence; performing a self-heating correction on a variation of the drain current caused by self-heating; performing a self-heating correction on an impact ionization rate caused by hot carriers; and predicting the lifetime of the SOI MOSFET device under a bias. The embodiment of the invention prevents the self-heating effect from affecting the SOI MOSFET device in a practical logic circuit or in an AC analog circuit, which leads to a more precise prediction result.

FIELD OF THE INVENTION

An embodiment of the invention relates to the technical field of semiconductor reliability. Since the self-heating effect of a SOI MOSFET device exacerbates the degradation degree of the device, while in a practical digital circuit the influence of the self-heating effect is very small, the embodiment of the invention mainly relates to a method for predicting a reliable lifetime of the SOI MOSFET device after a self-heating correction.

BACKGROUND OF THE INVENTION

With a rapid development of Very Large Scale Integrated circuits (VLSI) technology, the silicon integrated circuit process has entered a product manufacturing stage generally based on a feature size of deep submicron and even to ultra-deep submicron. The progress of fabrication process greatly increases quality and performance of VLSI while dramatically reduces the process cost of an individual chip, thus promotes the product popularization of integrated circuit and brings a new electronic information revolution. However, the operation voltage is not able to be scaled down in a proportion while the size of the device is scaled down. Therefore, various reliability problems are gradually becoming more serious, mainly including the hot carrier effect (HCI), the negative bias thermal instability (NBTI) and an time dependent dielectric breakdown (TDDB), etc.

SOI MOSFET device is a structure in which a monocrystalline silicon film is formed over an insulating substrate or a monocrystalline silicon film is formed over a supporting silicon substrate with an insulating layer interposed therebetween for separation. Compared with a conventional bulk silicon MOS device, the SOI MOSFET has advantages such as a good characteristic of electrical isolation, a small parasitic capacitance, easy to form a shallow junction, capable of avoiding latch-up effect and a good capability of radiation resistance and so on. However, due to the quite lower thermal conductivity of buried oxide layer in the SOI MOSFET device, the lattice temperature of a channel region in the device rises, resulting in a decrease of the on-state drain current of the device.

An essential idea of the accelerated lifetime testing is to extrapolate the feature of the lifetime in a normal stress level by using the feature of the lifetime in a high stress level. A key of achieving the essential idea is to establish a relationship between the feature of the lifetime and the stress level, i.e. an acceleration model. In the conventional stress acceleration process, the applied stress condition is a direct current (DC) voltage, and a corresponding time to failure (TTF) is used to predict the lifetime for the device applied into a digital circuit and an analog circuit. However, an error may occurr when predicting a logic circuit or an AC analog circuit operated in real world by the method. The reason is that, the generation of the self-heating effect is associated with the frequency of the operating circuit. More specifically, if the operating frequency is higher, the thermal response of the device is conducted so soon that a signal has not been built yet. Meanwhile, if the operating frequency is lower, the self-heating effect is getting more serious. Thus, in predicting the lifetime of the digital circuit in the high stress level, the influence on the lifetime from the self-heating effect should be eliminated, so that an accurate value of the reliable lifetime of the SOI MOSFET can be obtained.

SUMMARY OF THE INVENTION

An object of the invention is to provide a method for predicting the reliable lifetime of SOI MOSFETs fabricated by the same process under different bias conditions after the self-heating correction.

A technical solution according to an embodiment of the invention is as follows.

A method for predicting a reliable lifetime of a SOI MOSFET device, comprising:

a) measuring a relationship of a gate resistance of the SOI MOSFET device varying as a function of a temperature at different wafer temperatures T_(wafer) to obtain a resistance-temperature relationship coefficient α and a self-heating temperature T_(sh) at different biases; and measuring the substrate current I_(sub,sh) and drain current I_(d,sh) in the presence of self-heating;

b) performing a lifetime accelerating test on the SOI MOSFET device at different wafer temperatures T_(wafer), so as to obtain a degenerating relationship of a parameter representing the lifetime of the device as a function of stress time, and obtain the lifetime τ_(sh) in the presence of self-heating when the parameter degenerates to 10%;

c) performing a self-heating correction on the measured lifetime of the device by using the measured self-heating temperature and an Arrhenius model as shown in formula 1, so as to obtain a lifetime τ_(non) _(—) _(sh) after the influence of self-heating is removed:

$\begin{matrix} {\tau = {A_{0}{\exp \left( {E_{a}\text{/}k\; T} \right)}}} & \left( {{formula}\mspace{14mu} 1} \right) \\ {\tau_{non\_ sh} = {\tau_{sh}{\exp\left\lbrack {\frac{E_{a}}{k}\left( {\frac{1}{T_{wafer}} - \frac{1}{T_{wafer} + T_{sh}}} \right)} \right\rbrack}}} & \left( {{formula}\mspace{14mu} 2} \right) \end{matrix}$

where in the formula 1, τ is a lifetime, A₀ is a coefficient, E_(a) is activation energy, k is the Bolzmann constant, T is an absolute temperature; and in the formula 2, τ_(non) _(—) _(sh) is a lifetime when influence of self-heating is removed, τ_(sh) is the lifetime in the presence of influence of self-heating, E_(a) is activation energy which can be obtained by a fitting method, k is the Bolzmann constant, T_(wafer) is a wafer temperature, and T_(sh) is an extracted self-heating temperature;

d) performing a self-heating correction on a variation of a drain current caused by self-heating:

log I _(d,non) _(—) _(sh)=log I _(d,sh)−β log T _(sh)  (formula 3)

where I_(d,non) _(—) _(sh) is a drain current when influence of self-heating is removed, I_(d,sh) is a drain current when influence of self-heating is not removed, T_(sh) is an extracted self-heating temperature, and β is a coefficient (may be obtained by a data fitting method);

e) performing a self-heating correction on an impact ionization rate M caused by hot carriers, where M=I_(sub)/I_(d), I_(sub) is a substrate current, I_(d) is a drain current, and a formula used for the correction is:

log M _(non) _(—) _(sh)=log M _(sh)−γ log T _(sh)  (formula 4)

where M_(non) _(—) _(sh) is an impact ionization rate when influence of self-heating is removed, M_(sh) an impact ionization rate when influence of self-heating is not removed, T_(sh) is an extracted self-heating temperature, and γ is a coefficient (may be obtained by a data fitting method);

f) putting the respective parameters after self-heating correction, such as the lifetime τ_(non) _(—) _(sh), the drain current I_(d,non) _(—) _(sh) and the impact ionization rate M_(non) _(—) _(sh) into a standard Hu model [1] (as shown in formula 5), where M_(non) _(—) _(sh)=I_(sub,non) _(—) _(sh)/I_(d,non) _(—) _(sh), and constant coefficients A, B in the formulas are obtained by using a fitting method; after the drain current and the substrate current under a certain bias are measured, predicting the lifetime of the SOI MOSFET device under the bias through formula 6:

τ_(non) _(—) _(sh)·(I _(d,non) _(—) _(sh) /W)=A·(I _(sub,non) _(—) _(sh) /I _(d,non) _(—) _(sh))^(−B)  (formula 5)

τ_(non) _(—) _(sh)′=(A·W/I _(d,non) _(—) _(sh)′)(I _(sub,non) _(—) _(sh) ′/I _(d,non) _(—) _(sh)′)^(−B)  (formula 6)

where W is a channel width of the device, I_(sub,non) _(—) _(sh)′, I_(d,non) _(—) _(sh)′ and τ_(non) _(—) _(sh)′ are the drain current and the substrate current after self-heating correction, and the lifetime after influence of self-heating is removed, respectively, which are to be predicted under a bias condition.

Specifically, in the step a), the measuring the relationship of the gate resistance of the SOI MOSFET device varying as the function of the temperature comprises:

i) as for the SOI MOSFET having five terminals, two ends of a gate are opened with contact holes respectively and applied with a voltage Vg1 and a voltage Vg2 respectively when testing the gate resistance; in order to exclude an influence from a gate tunneling current on detection of a gate current Ig1 and Ig2, the voltages Vg1 and Vg2 are set as Vg1=Vg+ΔVg and Vg2=Vg−ΔVg, where Vg is the stress bias applied to the gate, and ΔVg takes different values respectively to measure the gate currents Ig1 i and Ig2 i (i=1, 2, 3, . . . , n); and Rg_(i)=4ΔVg_(i)/(Ig1 _(i)+Ig2 _(i)) is obtained, where Rg_(i) is the resistance measured at the ith time; and the gate resistance under a certain temperature and a certain bias is obtained as

${{R\; g} = {\sum\limits_{i = 1}^{n}\; {R\; g_{i}\text{/}n}}},$

where n is generally smaller than 5;

ii) performing the step i) at different wafer temperatures when the stress bias for the gate voltage Vg and the drain voltage Vd are zero, so as to obtain a relationship of the gate resistance varying as the function of wafer temperature in the absence of self-heating effect, where the relationship is represented by the resistance-temperature relationship coefficient α:

$\begin{matrix} {\alpha = \frac{{R\; {g\left( T_{high} \right)}} - {R\; {g\left( T_{ref} \right)}}}{T_{high} - T_{ref}}} & \left( {{formula}\mspace{14mu} 7} \right) \end{matrix}$

where T^(ref) is a reference temperature, Rg(T_(ref)) is a gate resistance measured at the reference temperature, T_(high) is a temperature higher than the reference temperature, and Rg(T_(high)) is a gate resistance measured at T_(high);

iii) performing the step i) at different wafer temperatures when the stress bias for the Vg and Vd are larger than zero, so as to measure the different gate resistances caused by different self-heating effect under different biases; and calculating the self-heating temperature T_(sh) by the resistance-temperature relationship coefficient α and the measured resistance Rg.

$\begin{matrix} {T_{sh} = \frac{{R\; {g\left( T_{high} \right)}} - {R\; {g\left( T_{ref} \right)}}}{\alpha}} & \left( {{formula}\mspace{14mu} 8} \right) \end{matrix}$

In the step a), the stress for testing the reliability is a hot electron injection (HCI) stress.

In the step b), the parameter representing the lifetime of the device is a maximum transconductance G_(m) _(—) _(max) or a saturation drain current^(I) _(dsat).

In the step i), a value of Vg should be much larger than ΔVg, and the value of ΔVg is smaller than 50 mV.

Compared with the conventional method for testing the lifetime of the SOI MOSFET device, the method provided by embodiments of the invention prevents a self-heating effect from affecting the prediction of a lifetime of a SOI MOSFET device in a practical logic circuit or in an AC analog circuit, which leads to a more precise prediction result.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a three-dimensional structural diagram of a SOI MOSFET device having body contacts at five terminals,

wherein, 101 is a buried layer; 102 is a gate terminal 1; 103 is a gate terminal 2; 104 is a source terminal; and 105 is a drain terminal;

FIG. 2 is a schematic diagram showing extracting a gate resistance;

FIG. 3 is a graph showing a relationship between a gate resistance and a wafer temperature;

FIG. 4 is a graph showing a maximum transconductance of the device degenerating as a function of the stress time;

FIG. 5 is a graph showing an Arrhenius relationship between the lifetime and the temperature;

FIG. 6 is a graph showing a relationship between the drain current and the temperature;

FIG. 7 is a graph showing a relationship between the impact ionization rate and the temperature; and

FIG. 8 is a graph showing a relationship of related parameters in the Hu model.

DETAILED DESCRIPTION OF THE EMBODIMENTS

A preferred embodiment of the invention will be described in more detail with reference to the accompany drawings.

In the embodiment, a SOI MOSFET device to be tested is a SOI NMOS device (a PMOS device is similar to it) having body contacts at five terminals, and a three-dimensional schematic view thereof is shown in FIG. 1. An NMOS transistor having a good process condition and a uniform interface state is selected. The width (W) and the length (L) of the device are 5 μm and 0.18 μm, respectively. The specific implementation steps are as follows.

1) The gate resistances under different wafer temperatures and stress biases are extracted. The method is described as follows. As shown in FIG. 2, a gate 1 and a gate 2 are applied with a voltage Vg1 and a voltage Vg2, respectively. In order to avoid the influence from the gate tunneling current on the detection of a current Ig1 and a current Ig2, the voltages Vg1 and Vg2 are set as Vg1=Vg+ΔVg and Vg2=Vg−ΔVg, where Vg is the stress bias applied to the gate (Vg is much larger than ΔVg), and ΔVg takes a value of 10 mV, 20 mV, 30 mV and 40 mV, respectively. Each of the gate current Ig1 i and Ig2 i (i=1, 2, 3, 4) is measured, and thus each of the gate resistances under different ΔVg is obtained: Rg_(i)=4ΔVg_(i)/(Ig1 _(i)+Ig2 _(i)). Therefore, the gate resistance under a certain stress bias Vg is obtained as

${R\; g} = {\sum\limits_{i = 1}^{n}\; {R\; g_{i}\text{/}{n.}}}$

2) The wafer temperature is set as T1=303K, T2=323K, T3=353K and T4=383K respectively, and the voltages are set as V_(g)=V_(d)=V_(stress)=0, where V_(stress) is the stress bias. The step 1) is performed at each of the above-mentioned temperatures, and thus a relationship of the gate resistance varying as a function of the temperature (the wafer temperature) in the absence of self-heating can be obtained, as shown in table 1. A constant of the resistance-temperature relationship coefficient is obtained as

$\alpha = {\frac{{R\; {g\left( T_{high} \right)}} - {R\; {g\left( T_{ref} \right)}}}{T_{high} - T_{ref}} = {0.69.}}$

Then, the value of the V_(stress) is changed to 0.8V, 1.2V, 1.6V, 2.0V, 2.2V, 2.4V, 2.6V, 2.8V and 3.0V, respectively, and similarly, the different gate resistances at each of various wafer temperatures are measured. Thus, a graph showing a distribution of the resistance and the temperature can be obtained according to the constant of the resistance-temperature relationship coefficient, as shown in FIG. 3.

TABLE 1 Temperature(K) T1 = 303 K T2 = 323 K T3 = 353 K T4 = 383 K Resistance 189.08646 203.12357 224.06666 243.25747 (Vstress = 0)

According a formula

${{\Delta \; T_{sh}} = \frac{{R\; {g\left( T_{high} \right)}} - {R\; {g\left( T_{ref} \right)}}}{\alpha}},$

self-heating temperatures under the stress bias of 2.4V, 2.6V, 2.8V and 3.0V at each of different wafer temperatures can be extracted. From FIG. 3 it can be seen that, at various wafer temperatures, the self-heating temperatures generated under the same bias are substantially the same.

TABLE 2 Vg = Vg = Vg = Vg = Vg = Vd = Vd = Vd = Vd = Vd = Temperature 0 2.4 2.6 2.8 3.0 V 30° 0 98.68 K 128.74 K 152.83 K 176.51 K 50° 0 99.62 K 123.64 K 159.01 K 180.53 K 80° 0 99.29 K 121.55 K 155.41 K 174.33 K 110°  0 101.36 K  121.93 K 161.670 K  179.88 K

3) The wafer temperature is set as T1=303K, and an HCI reliability test is performed on the SOI MOSFET device. The HCI stress bias (V_(g)=V_(d)=V_(stress)=2.6V, 2.8V, 3.0V) is applied. The source terminal and the body terminal are grounded, and the back gate is floated. The stress time is set to 6000 s. During applying the HCI stress bias, the gate current I_(g), the substrate current I_(sub) and the drain current I_(d) are sampled. Meanwhile, the HCI stress bias is interrupted at time points t=1 s, 2 s, 5 s, 10 s, 20 s, 50 s, 100 s, 200 s, 500 s, 1000 s, 2000 s, 4000 s and 6000 s to measure a transfer curve of the device, and thus to obtain a curve of a maximum transconductance degenerating as the function of the stress time, as shown in FIG. 4.

4) The step 3) is repeated at other wafer temperatures T2=323K, T3=353K, and T4=383K, and thus a temporal degenerating graph, which is similar to FIG. 4, is obtained. A time point at which the maximum transconductance is degenerated to 10% is selected as the lifetime end value. According to a relationship between the lifetime and the temperature in the Arrhenius model (as shown in formula 1), FIG. 5 is drawn to obtain a coefficient A₀ and activation energy E_(a) under different stresses by a fitting method.

Meanwhile, by means of formula 2 and the extracted activation energy E_(a),

${\tau_{non\_ sh} = {\tau_{sh}{\exp\left\lbrack {\frac{E_{a}}{k}\left( {\frac{1}{T_{wafer}} - \frac{1}{T_{wafer} + T_{sh}}} \right)} \right\rbrack}}},$

a lifetime with self-heating not removed and a lifetime with self-heating removed are obtained as follows.

TABLE 3 2.6 V 2.8 V 3.0 V Lifetime with Lifetime with Lifetime with Lifetime with Lifetime with Lifetime with Temperature self-heating self-heating self-heating self-heating self-heating self-heating (K) not removed removed not removed removed not removed removed 303 1350 s 12488.41 s  147 s 1874.72 s  21 s 326.15 s 323 1150 s 5638.28 s 120 s 835.70 s 19 s 162.22 s 353  950 s 2460.94 s  90 s 339.93 s 15 s  70.06 s 383  700 s 1157.24 s  68 s 168.38 s  9 s  27.68 s

5) According to the drain current measured in the step 3), a graph showing a relationship between the drain current and different temperatures is obtained as shown in FIG. 6. It can be seen that, the temperature and the drain current exhibit a double logarithm linearity relationship log I_(d)=C+β log T_(total), where C is a constant, T_(total) is a sum of a self-heating temperature and a wafer temperature. According to a coefficient β fitted and the self-heating temperature T_(sh) extracted above, a self-heating correction under such a condition can be performed log I_(d,non) _(—) _(sh)=log I_(d,sh)−β log T_(sh). A result of the corrected drain current is shown in table 4.

TABLE 4 Id, non_sh(A) T1 = 303 K T1 = 323 K T1 = 353 K T1 = 383 K 2.6 V 0.004745 A 0.004569 A 0.004404 A 0.003989 A 2.8 V 0.005485 A 0.005351 A 0.005202 A 0.004548 A 3.0 V 0.006861  0.00681   0.006683  0.005398 

6) According to the measured substrate current and a relationship between an impact ionization rate M and the substrate current and the drain current, a graph showing a relationship of the impact ionization rate M and different temperatures can be obtained (as shown in FIG. 7). It can be found that the temperature and the impact ionization rate also exhibit a double logarithm linearity relationship log M=D+γ log T_(total), where D is a constant. According to a coefficient γ fitted and the self-heating temperature T_(sh) extracted above, a self-heating correction under such a condition can be performed log M_(non) _(—) _(sh)=log M_(sh)−γ log T_(sh). A result of the corrected substrate current is shown in table 5.

TABLE 5 Mnon_sh T1 = 303 K T1 = 323 K T1 = 353 K T1 = 383 K 2.6 V 0.003983 A 0.004312 A 0.004496 A 0.005565 A 2.8 V 0.006764 A 0.006896 A 0.006786 A 0.00774 A  3.0 V 0.007841 A 0.007812 A 0.007646 A 0.009429 A

7) The respective corrected values after the self-heating correction of the lifetime, the substrate current and the drain current are put into a Hu model τ_(non) _(—) _(sh)·(I_(d,non) _(—) _(sh)/W)=A·(I_(sub,non) _(—) _(sh)/I_(d,non) _(—) _(sh))^(−B), and thus coefficients A and B of the formula at different temperatures can be obtained by a fitting method, respectively shown in FIG. 8 and Table 6.

TABLE 6 A B T1 = 303 K 3.9684e−5 4.52446 T1 = 323 K 1.0731e−5 4.6565 T3 = 353 K 2.0662e−7 5.31375 T4 = 383 K 1.7779e−8 5.67965

8) A standard voltage of the SOI MOSFET device is 1.8V. By putting the drain current and the impact ionization rate after self-heating correction into formula 6 τ_(non) _(—) _(sh)′=(A·W/I_(d,non) _(—) _(sh)′)(I_(sub,non) _(—) _(sh)′/I_(d,non) _(—) _(sh)′)^(−B) under an operating condition of room temperature 303K, and by using the coefficients A and B obtained by a fitting method, the lifetime that the maximum transconductance of the device degenerates to 10% under the operating condition can be calculated as about 10 years, which conforms to a life limitation for a normal operation.

REFERENCE

-   [1]1985 TED C. Hu “Hot-electron-induced MOSFET degradation—model,     monitor, and improvement” 

What is claimed is:
 1. A method for predicting a reliable lifetime of a SOI MOSFET device, characterized in that, the method comprises the following steps: a) measuring a relationship of a gate resistance of the SOI MOSFET device varying as a function of a temperature at different wafer temperatures T_(wafer) to obtain a resistance-temperature relationship coefficient α and a self-heating temperature T_(sh) at different biases; and measuring a substrate current I_(sub,sh) and a drain current I_(d,sh) in the presence of self-heating; b) performing a lifetime accelerating test on the SOI MOSFET device at different wafer temperatures T_(wafer), so as to obtain a degenerating relationship of a parameter representing the lifetime of the device as a function of stress time, and obtain a lifetime τ_(sh) in the presence of self-heating when the parameter degenerates to 10%; c) performing a self-heating correction on the measured lifetime of the device by using the measured self-heating temperature and an Arrhenius model as shown in formula 1, so as to obtain a lifetime τ_(non) _(—) _(sh) after influence of self-heating is removed: $\begin{matrix} {\tau = {A_{0}{\exp \left( {E_{a}\text{/}k\; T} \right)}}} & \left( {{formula}\mspace{14mu} 1} \right) \\ {\tau_{non\_ sh} = {\tau_{sh}{\exp\left\lbrack {\frac{E_{a}}{k}\left( {\frac{1}{T_{wafer}} - \frac{1}{T_{wafer} + T_{sh}}} \right)} \right\rbrack}}} & \left( {{formula}\mspace{14mu} 2} \right) \end{matrix}$ where in the formula 1, τ is a lifetime, A₀ is a coefficient, E_(a) is activation energy, k is the Bolzmann constant, T is an absolute temperature; and in the formula 2, τ_(non) _(—) _(sh) is a lifetime when influence of self-heating is removed, τ_(sh) is a lifetime in the presence of influence of self-heating, E_(a) is activation energy which can be obtained by a fitting method, k is the Bolzmann constant, T^(wafer) is a wafer temperature, and T_(sh) is an extracted self-heating temperature; d) performing a self-heating correction on a variation of a drain current caused by self-heating: log I _(d,non) _(—) _(sh) log I _(d,sh)−β log T _(sh)  (formula 3) where I_(d,non) _(—) _(sh) is a drain current when influence of self-heating is removed, I_(d,sh) is a drain current when influence of self-heating is not removed, T_(sh) is an extracted self-heating temperature, and β is a coefficient; e) performing a self-heating correction on an impact ionization rate M caused by hot carriers, where M=I_(sub)/I_(d), I_(sub) is a substrate current, I_(d) is a drain current, and a formula used for the correction is: log M _(non) _(—) _(sh)=log M _(sh)−γ log T _(sh)  (formula 4) where M_(non) _(—) _(sh) is an impact ionization rate when influence of self-heating is removed, M_(sh) an impact ionization rate when influence of self-heating is not removed, T_(sh) is an extracted self-heating temperature, and γ is a coefficient; f) putting the respective parameters after self-heating correction, the lifetime τ_(non) _(—) _(sh), the drain current I_(d,non) _(—) _(sh) and the impact ionization rate M_(non) _(—) _(sh) into a standard Hu model as shown in formula 5, where M_(non) _(—) _(sh)=I_(sub,non) _(—) _(sh)/I_(d,non) _(—) _(sh), and constant coefficients A, B in the formula are obtained by using a fitting method; after the drain current and the substrate current under a certain bias are measured, predicting the lifetime of the SOI MOSFET device under the bias through formula 6: τ_(non) _(—) _(sh)·(I _(d,non) _(—) _(sh) /W)=A·(I _(sub,non) _(—) _(sh) /I _(d,non) _(—) _(sh))^(−B)  (formula 5) τ_(non) _(—) _(sh)=(A·W/I _(d,non) _(—) _(sh)′)(I _(sub,non) _(—) _(sh) ′/I _(d,non) _(—) _(sh)′)^(−B)  (formula 6) where W is a channel width of the device, I_(sub,non) _(—) _(sh)′, I_(d,non) _(—) _(sh)′ and τ_(non) _(—) _(sh)′ are the drain current and the substrate current after self-heating correction, and the lifetime after influence of self-heating is removed, respectively, which are to be predicted under a bias condition.
 2. The method for predicting the reliable lifetime of the SOI MOSFET device according to claim 1, characterized in that, in the step a), the measuring the relationship of the gate resistance of the SOI MOSFET device varying as the function of the temperature comprises: i) as for the SOI MOSFET having five terminals, two ends of a gate are opened with contact holes respectively and applied with a voltage Vg1 and a voltage Vg2 respectively when testing a gate resistance; in order to exclude an influence from a gate tunneling current on detection of a gate current Ig1 and Ig2, the voltages Vg1 and Vg2 are set as Vg1=Vg+ΔVg and Vg2=Vg−ΔVg, where Vg is the stress bias applied to the gate, and ΔVg takes different values respectively to measure the gate currents Ig1 i and Ig2 i (i=1, 2, 3, . . . , n); and Rg_(i)=4ΔVg_(i)/(Ig1 _(i)+Ig2 _(i)) is obtained, where Rg_(i) is the resistance measured at the ith time; and the gate resistance under a certain temperature and a certain bias is obtained as ${{R\; g} = {\sum\limits_{i = 1}^{n}\; {R\; g_{i}\text{/}n}}},$  where n is generally smaller than 5; ii) performing the step i) at different wafer temperatures when the stress bias for the gate voltage Vg and the drain voltage Vd are zero, so as to obtain a relationship of the gate resistance varying as the function of wafer temperature in the absence of self-heating effect, where the relationship is represented by the resistance-temperature relationship coefficient α: $\begin{matrix} {\alpha = \frac{{R\; {g\left( T_{high} \right)}} - {R\; {g\left( T_{ref} \right)}}}{T_{high} - T_{ref}}} & \left( {{formula}\mspace{14mu} 7} \right) \end{matrix}$ where T_(ref) is a reference temperature, Rg(T_(ref)) is a gate resistance measured at the reference temperature, T_(high) is a temperature higher than the reference temperature, and Rg(T_(high)) is a gate resistance measured at T_(high); iii) performing the step i) at different wafer temperatures when the stress bias for the Vg and Vd are larger than zero, so as to measure the different gate resistances caused by different self-heating effect under different biases; and calculating the self-heating temperature T_(sh) by the resistance-temperature relationship coefficient α and the measured resistance Rg: $\begin{matrix} {T_{sh} = {\frac{{R\; {g\left( T_{high} \right)}} - {R\; {g\left( T_{ref} \right)}}}{\alpha}.}} & \left( {{formula}\mspace{14mu} 8} \right) \end{matrix}$
 3. The method for predicting the reliable lifetime of the SOI MOSFET device according to claim 1, characterized in that, in the step a), the stress for testing the reliability is a hot electron injection stress.
 4. The method for predicting the reliable lifetime of the SOI MOSFET device according to claim 1, characterized in that, in the step b), the parameter representing the lifetime of the device is a maximum transconductance G_(m) _(—) _(max) or a saturation drain current I_(dsat).
 5. The method for predicting the reliable lifetime of the SOI MOSFET device according to claim 2, characterized in that, in the step i), a value of Vg is much larger than ΔVg, and the value of ΔVg is smaller than 50 mV. 